Presentation	1997/2/21 Application of Neural Networks to Reliability Analysis Naohiro ISHII,
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Abstract(in English)	The relation between neural network and reliability analysis is an interesting problem in the systems analysis and information processing. The conventional reliability analysis plays an important role in the electronic devices, their systems and computer systems. Neural network has different aspects from those devices and systems in the application fields. The evaluation of the image processing is carried out by neural network. In this network, the image processing is done at the same time. Thus, the image reliability test, or evaluation is applied one after the other with the processing in the neural networks. In this study, we show these aspects in the neural networks.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	reliability test / neural networks with reliability test / degree of dependence / image processing / face recognition
Paper #	R96-37,EMD96-100
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Conference Information
Committee	EMD
Conference Date	1997/2/21(1days)
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Paper Information
Registration To	Electromechanical Devices (EMD)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	Application of Neural Networks to Reliability Analysis
Sub Title (in English)
Keyword(1)	reliability test
Keyword(2)	neural networks with reliability test
Keyword(3)	degree of dependence
Keyword(4)	image processing
Keyword(5)	face recognition
1st Author's Name	Naohiro ISHII
1st Author's Affiliation	Department of Intelligence and Computer Science, Nagoya Institute of Technology()
Date	1997/2/21
Paper #	R96-37,EMD96-100
Volume (vol)	vol.96
Number (no)	542
Page	pp.pp.-
#Pages	8
Date of Issue