| Presentation | 2000/10/13 Evaluation of Image Contrast in Scanning Near-field Millimeter-wave Microscope with a Slit-type probe Tetze Hamano, Shuji Nuimura, Fumio Watanabe, Tatsuo Nozokido, Jongsuck Bae, Koji Mizuno, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Scanning near-field microscopy in the millimeter wave region is applicable to non-destructive test of a material, in high spatial resolution much smaller than the wavelength. In our scanning near-field microscope system, the reflection coefficients of object provide its image contrast. Consequently, the material constant of object, which actively determines the reflection coefficients, such as relative dielectric constant, can be evaluated from the image contrast quantity. The following two points for the quantification evaluation are presented in this paper : 1) the improvement of the microscopy system in order to reduce the remarkable "noise" caused by any planar objects, and 2) the development of equivalent circuit of our microscope system having a slit-type probe. Applying a hemisphere-shaped or a higher tanδ material base under an object reduced the fluctuation of the measured data from more than 10% down to less than 5%, and the calculation data by the daveloped equivalent circuit was comparable to the measurement ones. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | millimeter waves / scanning near-field microscope / slit-type probe / surface wave propagation |
| Paper # | EMCJ2000-77,MW2000-121 |
| Date of Issue |
| Conference Information | |
| Committee | MW |
|---|---|
| Conference Date | 2000/10/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Microwaves (MW) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Evaluation of Image Contrast in Scanning Near-field Millimeter-wave Microscope with a Slit-type probe |
| Sub Title (in English) | |
| Keyword(1) | millimeter waves |
| Keyword(2) | scanning near-field microscope |
| Keyword(3) | slit-type probe |
| Keyword(4) | surface wave propagation |
| 1st Author's Name | Tetze Hamano |
| 1st Author's Affiliation | Research Institute of Electrical Communication, Tohoku University() |
| 2nd Author's Name | Shuji Nuimura |
| 2nd Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| 3rd Author's Name | Fumio Watanabe |
| 3rd Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| 4th Author's Name | Tatsuo Nozokido |
| 4th Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| 5th Author's Name | Jongsuck Bae |
| 5th Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| 6th Author's Name | Koji Mizuno |
| 6th Author's Affiliation | Research Institute of Electrical Communication, Tohoku University |
| Date | 2000/10/13 |
| Paper # | EMCJ2000-77,MW2000-121 |
| Volume (vol) | vol.100 |
| Number (no) | 366 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |