Presentation 1994/11/25
Development of Measuring Technique of Temperature Characteristic of Dielectric Ceramics for Microwave Application Using Photo Thermal Dielectric Microscope
Yasuo Cho, Koji Yokoyama, Tomoyuki Kumamaru, Akio Kirihara,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A photo thermal dielectric microscope(PTDM)for measuring the temprature characteristic of dielectric materials for microwave application is developed.Next,it is successfully demonstrated that the temperature characteristics of the dielectric ceramics are measured with enough accuracy at the microwave frequency range by using this PTDM
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Keyword(in English) Photo thermal dielectric microscope / Dielectric ceramics / Temperature characteristics of dielectric constant
Paper # MW94-73
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Conference Date 1994/11/25(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of Measuring Technique of Temperature Characteristic of Dielectric Ceramics for Microwave Application Using Photo Thermal Dielectric Microscope
Sub Title (in English)
Keyword(1) Photo thermal dielectric microscope
Keyword(2) Dielectric ceramics
Keyword(3) Temperature characteristics of dielectric constant
1st Author's Name Yasuo Cho
1st Author's Affiliation Department of Electrikal and Electronic Engineering,Faculty of Engineering,Yamaguchi University()
2nd Author's Name Koji Yokoyama
2nd Author's Affiliation Department of Electrikal and Electronic Engineering,Faculty of Engineering,Yamaguchi University
3rd Author's Name Tomoyuki Kumamaru
3rd Author's Affiliation Department of Electrikal and Electronic Engineering,Faculty of Engineering,Yamaguchi University
4th Author's Name Akio Kirihara
4th Author's Affiliation Department of Electrikal and Electronic Engineering,Faculty of Engineering,Yamaguchi University
Date 1994/11/25
Paper # MW94-73
Volume (vol) vol.94
Number (no) 375
Page pp.pp.-
#Pages 6
Date of Issue