Presentation 1998/11/19
Measurement precisions of surface resistance of high-Tc superconductor films by dielectric resonator method
Shingo Okajima, Hiromichi Yoshikawa, Yoshio Kobayashi,
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Abstract(in English) For microwave measurement of surface resistance R_s of superconductors, measurement precisions are discussed for dielectric resonator methods of two types ; one uses a TE_011 resonator and a TE_013 resonator (a two-resonator method) and the other uses TE_012 and TE_021 modes of a dielectric resonator (a one-resonator method). It is found that measurement error for R_s of YBCO films is 10 percents for the two-resonator method using sapphire rods and 40 percents for the one-resonator method using BMT ceramic rod. Therefore, it is essential to use the low loss dielectric material for the measurement low R_s value. Moreover, we calculate the best diameter to length ratio of dielectric rod to measure the superconductor plates and films with the smallest area.
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Keyword(in English) high-Tc superconductors / microwave / surface resistance
Paper # MW98-115
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Conference Date 1998/11/19(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Measurement precisions of surface resistance of high-Tc superconductor films by dielectric resonator method
Sub Title (in English)
Keyword(1) high-Tc superconductors
Keyword(2) microwave
Keyword(3) surface resistance
1st Author's Name Shingo Okajima
1st Author's Affiliation Faculty of Engineering, Saitama University()
2nd Author's Name Hiromichi Yoshikawa
2nd Author's Affiliation Faculty of Engineering, Saitama University
3rd Author's Name Yoshio Kobayashi
3rd Author's Affiliation Faculty of Engineering, Saitama University
Date 1998/11/19
Paper # MW98-115
Volume (vol) vol.98
Number (no) 419
Page pp.pp.-
#Pages 6
Date of Issue