Presentation 1996/6/26
Focusing Properties Analysis of X-ray Waveguide Type Focusing Functional Devices using Beam Propagation Method
Takashi Okuyama, Yasumitsu Miyazaki,
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Abstract(in English) Recently in the field of x-ray applications many types of functional devices that need compact design have become necessary. X-ray focusing devices can be divided into diffraction and total reflection types, but those based on refraction have not been well discussed until now. In this study, we consider functional devices for focusing X-rays. Here we propose X-ray focusing devices based on distributed refractive index medium. Then Beam Propagation Method is utilized to investigate the properties of propagating X-rays in a distributed index medium. Furthermore, a loss term is introduced into Beam Propagation Method and focusing properties of X-ray waveguide type focusing functional devices are analysed.
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Keyword(in English) X-ray waveguide type focusing functional devices / beam propagation method / distributed refractive index medium
Paper # MW96-32,OPE96-12
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Conference Date 1996/6/26(1days)
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Title (in Japanese) (See Japanese page)
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Title (in English) Focusing Properties Analysis of X-ray Waveguide Type Focusing Functional Devices using Beam Propagation Method
Sub Title (in English)
Keyword(1) X-ray waveguide type focusing functional devices
Keyword(2) beam propagation method
Keyword(3) distributed refractive index medium
1st Author's Name Takashi Okuyama
1st Author's Affiliation Dept. of Infor. Syst., Fac. of Eng., Toyohashi Univ. of Tech.()
2nd Author's Name Yasumitsu Miyazaki
2nd Author's Affiliation Dept. of Infor. Syst., Fac. of Eng., Toyohashi Univ. of Tech.
Date 1996/6/26
Paper # MW96-32,OPE96-12
Volume (vol) vol.96
Number (no) 136
Page pp.pp.-
#Pages 6
Date of Issue