Presentation 2002/2/28
Technology Trend of IP-Reuse on System LSI Design
Tadahiko Nakamura,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) IP Reuse-based design methodology has been devised to improve design productivity in SoC designs, but the applied range of IP Reuse is limited. IP-data required has so wide varieties, and deeply depend on the process technology and design environment for semiconductor companies. It is very difficult for IP-User to select the best IP before starting the SoC design procedure. The STARC IP-based design technology set is the solution for these difficulties. The set includes (1) technical infrastructures such as the design style guide and IP trading standard, (2) common design rules of 2D geometries and SPICE parameters, (3) IP libraries. STRAC and its twelve member companies agreed to promote the technology set throughout the SoC industry to make IP trade and reuse much more efficient among the adopting companies.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SoC / IP / reuse / 2D geometries / SPICE parameters / delivery / Silicon proven IP
Paper # ICD2001-234
Date of Issue

Conference Information
Committee ICD
Conference Date 2002/2/28(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Technology Trend of IP-Reuse on System LSI Design
Sub Title (in English)
Keyword(1) SoC
Keyword(2) IP
Keyword(3) reuse
Keyword(4) 2D geometries
Keyword(5) SPICE parameters
Keyword(6) delivery
Keyword(7) Silicon proven IP
1st Author's Name Tadahiko Nakamura
1st Author's Affiliation Semiconductor Technology Academic Research Center (STARC)()
Date 2002/2/28
Paper # ICD2001-234
Volume (vol) vol.101
Number (no) 696
Page pp.pp.-
#Pages 7
Date of Issue