| Presentation | 2001/5/18 Self-Heating Free Parameter Extraction and Circuit Simulation for SOI CMOS Hajime Nakayama, Pin Su, Chenming Hu, Motoaki Nakamura, Hiroshi Komatsu, Kaneyoshi Takeshita, Yasutoshi Komatsu, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Novel SOI (Silicon On Insulator) model parameter extraction methodology based on the concept of SHE (Self-Heating Effect) free device modeling, is proposed and demonstrated for a 0.18 μm PD (Partially Depleted) SOI technology. In this technology, prior to SPICE parameter extraction, the device thermal resistances are measured and the current loss due to SHE is added back analytically to dc IV data. Therefore, the parameters are free from SHE. Dc, ac, and transient simulation results using this technology show good agreement with measurement data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | SOI / Self-Heating Effect / SPICE simulation / SPICE parameter / thermal resistance |
| Paper # | ICD2001-24 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2001/5/18(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Self-Heating Free Parameter Extraction and Circuit Simulation for SOI CMOS |
| Sub Title (in English) | |
| Keyword(1) | SOI |
| Keyword(2) | Self-Heating Effect |
| Keyword(3) | SPICE simulation |
| Keyword(4) | SPICE parameter |
| Keyword(5) | thermal resistance |
| 1st Author's Name | Hajime Nakayama |
| 1st Author's Affiliation | LSI Technology Development Division, SONY Corp.() |
| 2nd Author's Name | Pin Su |
| 2nd Author's Affiliation | Department of EECS, University of California at Berkeley |
| 3rd Author's Name | Chenming Hu |
| 3rd Author's Affiliation | Department of EECS, University of California at Berkeley |
| 4th Author's Name | Motoaki Nakamura |
| 4th Author's Affiliation | LSI Technology Development Division, SONY Corp. |
| 5th Author's Name | Hiroshi Komatsu |
| 5th Author's Affiliation | LSI Technology Development Division, SONY Corp. |
| 6th Author's Name | Kaneyoshi Takeshita |
| 6th Author's Affiliation | LSI Technology Development Division, SONY Corp. |
| 7th Author's Name | Yasutoshi Komatsu |
| 7th Author's Affiliation | LSI Technology Development Division, SONY Corp. |
| Date | 2001/5/18 |
| Paper # | ICD2001-24 |
| Volume (vol) | vol.101 |
| Number (no) | 85 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |