Presentation 2001/3/2
Evaluation Using Transfer Function and Analysis of Power Supply Noise
S. Sugiyama, M. Ikeda, K. Asada, H. Aoki,
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Abstract(in English) With increasing interconnect densities, voltage bounce noise in power supply lines is becoming to an important problem. In this paper we present a new methodology for the evaluation of power supply noise, caused by digital switching activity. Utilizing matrix-tranfer function and power spectrum and focusing on the average noise, this method enables analysis of the chip level power supply noise in reasonable analysis time. To verify this method, we designed and fabricated VLSI test structure to measure the noise in the power supply lines. Since the circuit is designed to output results as digital value using a voltage comparator of sampling method, the noise mixed during the measurement is considered smaller than analog methods.
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Keyword(in English) VLSI / power supply noise / transfer function / comparator / simulation
Paper # VLD2000-144,ICD2000-220
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Conference Date 2001/3/2(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation Using Transfer Function and Analysis of Power Supply Noise
Sub Title (in English)
Keyword(1) VLSI
Keyword(2) power supply noise
Keyword(3) transfer function
Keyword(4) comparator
Keyword(5) simulation
1st Author's Name S. Sugiyama
1st Author's Affiliation Department of Electronic Engineering, University of Tokyo:VLSI Design and Education Center, University of Tokyo()
2nd Author's Name M. Ikeda
2nd Author's Affiliation Department of Electronic Engineering, University of Tokyo:VLSI Design and Education Center, University of Tokyo
3rd Author's Name K. Asada
3rd Author's Affiliation Department of Electronic Engineering, University of Tokyo:VLSI Design and Education Center, University of Tokyo
4th Author's Name H. Aoki
4th Author's Affiliation Department of Electronic Engineering, University of Tokyo:VLSI Design and Education Center, University of Tokyo
Date 2001/3/2
Paper # VLD2000-144,ICD2000-220
Volume (vol) vol.100
Number (no) 648
Page pp.pp.-
#Pages 6
Date of Issue