Presentation 2001/1/11
Low-Distortion and High Output Power Pulse-doped GaAs MESFETs with Asymmetric LDD structure
K. Nakata, K. Otobe, S. Nakajima,
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Abstract(in English) We have adopted an asymmetric LDD structure to pulse-doped FET. An n′implanted region was optimized to reduce effect of impact ionization phenomenon. As a result, an on state breakdown voltage was improved to over 22V, and a saturation output power of 905mW/mm was achieved at 15V operation. The Inearity of gm and gd were also improved, and then highest PAE of 39.5% at low back off (IM3=-35dBc) was achieved.
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Keyword(in English) MESFET / Digital wireless communication / Low distortion / High output power / Impact ionization
Paper # ED2000-227,MW2000-176,ICD2000-187
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Conference Date 2001/1/11(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
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Title (in English) Low-Distortion and High Output Power Pulse-doped GaAs MESFETs with Asymmetric LDD structure
Sub Title (in English)
Keyword(1) MESFET
Keyword(2) Digital wireless communication
Keyword(3) Low distortion
Keyword(4) High output power
Keyword(5) Impact ionization
1st Author's Name K. Nakata
1st Author's Affiliation Advanced High-speed Devices Business Department, Sumitomo Electric Industry, LTD()
2nd Author's Name K. Otobe
2nd Author's Affiliation Advanced High-speed Devices Business Department, Sumitomo Electric Industry, LTD
3rd Author's Name S. Nakajima
3rd Author's Affiliation Advanced High-speed Devices Business Department, Sumitomo Electric Industry, LTD
Date 2001/1/11
Paper # ED2000-227,MW2000-176,ICD2000-187
Volume (vol) vol.100
Number (no) 554
Page pp.pp.-
#Pages 6
Date of Issue