| Presentation | 2000/11/23 An Investigation of Delay Fluctuation in Logic-Gate with using an EB-Tester Xiang Li, Kazutoshi Kobayashi, Hidetoshi Onodera, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the improvement of fabrication technologies, the increased effect of fluctuation in MOSFET device characteristics become an important theme in designing CMOS integrated circuits.The modeling of MOSFET parameters considered with the fluctuation of device characteristics is required.Therefore, extremely accuracy of some information about fluctuation of device characteristics such as the range, Distribution etc.is required.In this paper, we discuss a possibility about the analysis of fluctuation of gate delay with using an EB tester. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | EB-tester / Fluctuation / Delay / Distribution / Error |
| Paper # | VLD2000-73,ICD2000-130,FTS2000-38 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2000/11/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Investigation of Delay Fluctuation in Logic-Gate with using an EB-Tester |
| Sub Title (in English) | |
| Keyword(1) | EB-tester |
| Keyword(2) | Fluctuation |
| Keyword(3) | Delay |
| Keyword(4) | Distribution |
| Keyword(5) | Error |
| 1st Author's Name | Xiang Li |
| 1st Author's Affiliation | Graduate School of Informatics, Kyoto University() |
| 2nd Author's Name | Kazutoshi Kobayashi |
| 2nd Author's Affiliation | Graduate School of Informatics, Kyoto University |
| 3rd Author's Name | Hidetoshi Onodera |
| 3rd Author's Affiliation | Graduate School of Informatics, Kyoto University |
| Date | 2000/11/23 |
| Paper # | VLD2000-73,ICD2000-130,FTS2000-38 |
| Volume (vol) | vol.100 |
| Number (no) | 474 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |