Presentation | 2000/5/4 Reduced Substrate Noise Digital Design for Improving Embedded Analog Performance Makoto Nagata, Katsumasa Hijikata, Jin Nagai, Takashi Morie, Atsushi Iwata, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Reduced Supply Bounce CMOS suppresses substrate noise amplitude to ≤ 33% of conventional CMOS, by optimizing recharge time constant of local charge reservoirs for fast logic transitions. In order to compare substrate noise amount among conventional logic circuits and the propose circuits, substrate noise is quantitatively measured in 100ps 100μV resolution by a latch comparator with a gain calibrated front-end level shifter having 2GHz BW. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Mixed Analog-Digital LSI / Crosstalk / Substrate Noise / Substrate Noise Measurement |
Paper # | ICD2000-17 |
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Committee | ICD |
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Conference Date | 2000/5/4(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Reduced Substrate Noise Digital Design for Improving Embedded Analog Performance |
Sub Title (in English) | |
Keyword(1) | Mixed Analog-Digital LSI |
Keyword(2) | Crosstalk |
Keyword(3) | Substrate Noise |
Keyword(4) | Substrate Noise Measurement |
1st Author's Name | Makoto Nagata |
1st Author's Affiliation | Faculty of Engineering, Hiroshima University() |
2nd Author's Name | Katsumasa Hijikata |
2nd Author's Affiliation | now with Matsushita Electric Industrial Co., Ltd. |
3rd Author's Name | Jin Nagai |
3rd Author's Affiliation | Faculty of Engineering, Hiroshima University |
4th Author's Name | Takashi Morie |
4th Author's Affiliation | Faculty of Engineering, Hiroshima University |
5th Author's Name | Atsushi Iwata |
5th Author's Affiliation | Faculty of Engineering, Hiroshima University |
Date | 2000/5/4 |
Paper # | ICD2000-17 |
Volume (vol) | vol.100 |
Number (no) | 41 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |