| Presentation | 1999/7/23 On-Chip Extraction of Interconnect Line Induced Delay Time for Quarter and Sub-Quarter Micron CMOS Technology Hi-Deok Lee, Myoung-Jun Jang, Myoung-Kyu Park, Dae-Gwan Kang, Jeong-Mo Hwang, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Interconnect parasitic parameters and their contribution to delay time are extracted on chip environment. Six kinds of test patterns are used to extract each interconnect parameters. The extracted parameters and their contribution to delay time are summarized in a look-up table. The circuit performance can be easily predicted using the look-up table. Moreover, the usefulness of the look-up table in designing repeaters is also shown. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Interconnect / Delay time / On-chip extraction / CMOS technology |
| Paper # | ICD99-108 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 1999/7/23(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On-Chip Extraction of Interconnect Line Induced Delay Time for Quarter and Sub-Quarter Micron CMOS Technology |
| Sub Title (in English) | |
| Keyword(1) | Interconnect |
| Keyword(2) | Delay time |
| Keyword(3) | On-chip extraction |
| Keyword(4) | CMOS technology |
| 1st Author's Name | Hi-Deok Lee |
| 1st Author's Affiliation | R&D Division, LG Semicon Co., Ltd.() |
| 2nd Author's Name | Myoung-Jun Jang |
| 2nd Author's Affiliation | R&D Division, LG Semicon Co., Ltd. |
| 3rd Author's Name | Myoung-Kyu Park |
| 3rd Author's Affiliation | R&D Division, LG Semicon Co., Ltd. |
| 4th Author's Name | Dae-Gwan Kang |
| 4th Author's Affiliation | R&D Division, LG Semicon Co., Ltd. |
| 5th Author's Name | Jeong-Mo Hwang |
| 5th Author's Affiliation | R&D Division, LG Semicon Co., Ltd. |
| Date | 1999/7/23 |
| Paper # | ICD99-108 |
| Volume (vol) | vol.99 |
| Number (no) | 234 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |