Presentation 1999/7/22
A 0.1μm CMOS Technology using W/WN_x/Polysilicon Dual Gate Electrode for 4G DRAM and Beyond
Jun-Oh Choi, Sung-Keun Chang, Sang-Hee Lee, Seon-Soon Kim, Yong-Hae Kim, Dae-Hee Hahn, Hyung-Duck Kim,
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Abstract(in English) A 0.1μm CMOS Technology using W/WN_x/Polysilicon dual gate electrode for 4G DRAM is presented in this paper. The polymetal(W/WN_x/Polysilicon) gate is defined down to 0.12μm and it shows 3.3Ω/□ sheet resistance. We make the surface channel pMOSFET(SC-pMOSFET) with 4.5nm pure oxide gate dielectric. It shows high short channel immunity, no boron penetration and good charge-to-breakdown(Q_) distribution.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) W/WN_x/Polysilicon / 4G DRAM / dual gate electrode / tungsten / surface channel pMOSFET(SC-pMOSFET)
Paper # ICD99-63
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Conference Date 1999/7/22(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A 0.1μm CMOS Technology using W/WN_x/Polysilicon Dual Gate Electrode for 4G DRAM and Beyond
Sub Title (in English)
Keyword(1) W/WN_x/Polysilicon
Keyword(2) 4G DRAM
Keyword(3) dual gate electrode
Keyword(4) tungsten
Keyword(5) surface channel pMOSFET(SC-pMOSFET)
1st Author's Name Jun-Oh Choi
1st Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics()
2nd Author's Name Sung-Keun Chang
2nd Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
3rd Author's Name Sang-Hee Lee
3rd Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
4th Author's Name Seon-Soon Kim
4th Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
5th Author's Name Yong-Hae Kim
5th Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
6th Author's Name Dae-Hee Hahn
6th Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
7th Author's Name Hyung-Duck Kim
7th Author's Affiliation Semiconductor Advanced Research Division, Hyundai Electronics
Date 1999/7/22
Paper # ICD99-63
Volume (vol) vol.99
Number (no) 233
Page pp.pp.-
#Pages 5
Date of Issue