Presentation 1999/5/27
A 1.6 GByte/s DRAM with Flexible Mapping Redundancy Technique and Additional Refresh Scheme
Hiroshi Ito, Satoru Takase, Natsuki Kushiyama,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper describes the two circuit technologies adopted for a 1,6GByte/s 72Mb Direct RDRAM with 16 independent bank architecture. "Flexible Mapping Redundancy Technique" suits for multi-bank, multi-bit memory, because flexible relationship between spare element and fuse-set allows to reduce the number of fuse-set. This achieved 13% smaller chip size for the DRAM with 16 banks than the conventional 1-to-1 redundancy. Also, it is introduced "Additional Refresh Scheme" which use longer refresh period and add the refresh operation only for weak cells. With this scheme, the refresh current of the DRAM is reduced to about 1/4 with 0.6% area penalty.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) DRAM / multi bank / redundancy / refresh
Paper # ICD99-20
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Conference Date 1999/5/27(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A 1.6 GByte/s DRAM with Flexible Mapping Redundancy Technique and Additional Refresh Scheme
Sub Title (in English)
Keyword(1) DRAM
Keyword(2) multi bank
Keyword(3) redundancy
Keyword(4) refresh
1st Author's Name Hiroshi Ito
1st Author's Affiliation Microelectronics Engineering Laboratory, Toshiba Semiconductor Company()
2nd Author's Name Satoru Takase
2nd Author's Affiliation Microelectronics Engineering Laboratory, Toshiba Semiconductor Company
3rd Author's Name Natsuki Kushiyama
3rd Author's Affiliation Microelectronics Engineering Laboratory, Toshiba Semiconductor Company
Date 1999/5/27
Paper # ICD99-20
Volume (vol) vol.99
Number (no) 93
Page pp.pp.-
#Pages 7
Date of Issue