Presentation 1994/11/25
Required characteristics of die bond materials to improve the popcorn resistance of plastics surface mounted devices
Masahiko Yukawa, Tohru Terasaki, Tomoshi Ohde,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) We investigated the way to prevent the popcorn phenomena from viewpoint of the characteristics of die bond paste,die pad structue and mold resin.Ag paste characteristics remarkably influence on the anti-cracking performance of plastics package consist of biphenyl type mold resin and 42 alloy.Copper lead frame is remarkably difficult to improve,but we can find out that new film type die bond materials,with characteristics of higher adhesion and lower moisture adsorption,will be able to improve the popcorn resistance.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) package crack / die bond material / adhesion / solubility coefficient / Cu lead frame
Paper # ICD94-152
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Conference Date 1994/11/25(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Required characteristics of die bond materials to improve the popcorn resistance of plastics surface mounted devices
Sub Title (in English)
Keyword(1) package crack
Keyword(2) die bond material
Keyword(3) adhesion
Keyword(4) solubility coefficient
Keyword(5) Cu lead frame
1st Author's Name Masahiko Yukawa
1st Author's Affiliation Semiconductor Company,Sony Corporation()
2nd Author's Name Tohru Terasaki
2nd Author's Affiliation Semiconductor Company,Sony Corporation
3rd Author's Name Tomoshi Ohde
3rd Author's Affiliation Semiconductor Company,Sony Corporation
Date 1994/11/25
Paper # ICD94-152
Volume (vol) vol.94
Number (no) 361
Page pp.pp.-
#Pages 7
Date of Issue