Presentation 1994/11/25
Development and Application of Piezoresistance Stress Sensor
Kikuko Sugimae, Tsutomu Nakazawa, Kanako Sawada, Toshio Sudo, Morihiko Ikemizu, Hiroyuki Kozono, Sigeki Sakoh, Hiromichi Sawaya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) This Paper describes the development of stress sensor for the measurement of an internal stress in plastic package.This stress sensor uses the piezoresistive effect.First,the piezoresistive coefficients(π11+π12,π44)are determined using Four-Point bending strip of silicon. Next,the compress stress after molding process are obtained from 80 to 120 MPa.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) piezoresistive / stress / plastic / sensor
Paper # ICD94-150
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Conference Date 1994/11/25(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development and Application of Piezoresistance Stress Sensor
Sub Title (in English)
Keyword(1) piezoresistive
Keyword(2) stress
Keyword(3) plastic
Keyword(4) sensor
1st Author's Name Kikuko Sugimae
1st Author's Affiliation Semiconductor Device Engineering Laboratory,Toshiba Corporation()
2nd Author's Name Tsutomu Nakazawa
2nd Author's Affiliation Semiconductor Device Engineering Laboratory,Toshiba Corporation
3rd Author's Name Kanako Sawada
3rd Author's Affiliation Semiconductor Device Engineering Laboratory,Toshiba Corporation
4th Author's Name Toshio Sudo
4th Author's Affiliation Semiconductor Device Engineering Laboratory,Toshiba Corporation
5th Author's Name Morihiko Ikemizu
5th Author's Affiliation Semiconductor Manufacturigand and Engineering Department,Toshiba Corp
6th Author's Name Hiroyuki Kozono
6th Author's Affiliation Semiconductor Manufacturigand and Engineering Department,Toshiba Corp
7th Author's Name Sigeki Sakoh
7th Author's Affiliation Semiconductor Manufacturigand and Engineering Department,Toshiba Corp
8th Author's Name Hiromichi Sawaya
8th Author's Affiliation Semiconductor Manufacturigand and Engineering Department,Toshiba Corp
Date 1994/11/25
Paper # ICD94-150
Volume (vol) vol.94
Number (no) 361
Page pp.pp.-
#Pages 8
Date of Issue