| Presentation | 1999/1/20 Thermal Capacitance Noise and Operation Reliability of High-Speed Ultimate-Low Power MOS Circuit Masaaki Hayashi, Chugo Fujihashi, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Low power technology for a high speed circuit may be ultimately required to be reached to a level where the circuit is operated with countable small number electrons. For analysis of thermal energy noise, a probability for the number of electrons in a load capacitance induced by thermal energy is derived. The probability is combined with a probability for the number of electrons in the load capacitance by external voltage, and then a combined probability for total noise effect is derived. Operation reliability is examined by error probability based on the combined probability/ |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | MOS / Super-high-speed / Low power / Operation reliability / thermal capacity noise / Dynamic inverter |
| Paper # | ED98-196,MW98-159,ICD98-263 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 1999/1/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Thermal Capacitance Noise and Operation Reliability of High-Speed Ultimate-Low Power MOS Circuit |
| Sub Title (in English) | |
| Keyword(1) | MOS |
| Keyword(2) | Super-high-speed |
| Keyword(3) | Low power |
| Keyword(4) | Operation reliability |
| Keyword(5) | thermal capacity noise |
| Keyword(6) | Dynamic inverter |
| 1st Author's Name | Masaaki Hayashi |
| 1st Author's Affiliation | Department of Eldctronic Engineering, Tokyo Institute of Polytechnics() |
| 2nd Author's Name | Chugo Fujihashi |
| 2nd Author's Affiliation | Department of Eldctronic Engineering, Tokyo Institute of Polytechnics |
| Date | 1999/1/20 |
| Paper # | ED98-196,MW98-159,ICD98-263 |
| Volume (vol) | vol.98 |
| Number (no) | 523 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |