Presentation | 1998/10/22 An Analysis on Hi-Frequency Interconnections in VLSI Considering Inductive Effects T. Mido, K. Asada, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this study, we evaluated the magnitude of inductive effects on propagation delay in VLSI system with taking skin effect into account. As a result of numerical simulation, we mentioned that it is not important to take the skin effect into account in evaluating propagation delay of VLSI interconnections. Because in such a high frequency operation as the skin effect appears, in place of resistance that is influenced by the skin effect mainly, inductance becomes the dominant component of characteristic impedance of interconnections. On the other hand, it is very important to take the inductance into account in evaluating propagation delay of VLSI interconnections in over GHz operation, and it becomes one of the restriction factors of width or length of interconnections. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | VLSI / Interconnections / Skin Effect / Inductance / Wiring Delay / Capacitance |
Paper # | VLD98-84,ED98-109,SDM98-145,ICD98-215 |
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Conference Information | |
Committee | ICD |
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Conference Date | 1998/10/22(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | An Analysis on Hi-Frequency Interconnections in VLSI Considering Inductive Effects |
Sub Title (in English) | |
Keyword(1) | VLSI |
Keyword(2) | Interconnections |
Keyword(3) | Skin Effect |
Keyword(4) | Inductance |
Keyword(5) | Wiring Delay |
Keyword(6) | Capacitance |
1st Author's Name | T. Mido |
1st Author's Affiliation | Department of Electronic Engineering, University of Tokyo:VDEC, Univ.of Tokyo() |
2nd Author's Name | K. Asada |
2nd Author's Affiliation | Department of Electronic Engineering, University of Tokyo:VDEC, Univ.of Tokyo |
Date | 1998/10/22 |
Paper # | VLD98-84,ED98-109,SDM98-145,ICD98-215 |
Volume (vol) | vol.98 |
Number (no) | 351 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |