Presentation 1998/6/19
A sub-0.1um circuit design with substrate-over-biasing
Shigeyoshi Watanabe, Yukihito Oowaki, Mitsuhiro Noguchi, Tuneaki Fuse, Kazumasa Sunouchi, Hitomi Kawaguchiya,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The substrate over-biasing technique together with gate-substrate tie technique has been proposed. This circuitry satisfies the highest speed, low leakage current and compatibility with presentry available circuit technologies. With 80nm process technology, 40ps gate delay which correspond to 2GHz operation is achievable at 0.5V supply voltage.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) 0.5V supply voltage / sub-0.1un device / substrate over-biasing technology
Paper # ED98-72,SDM98-72,ICD98-71
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Conference Date 1998/6/19(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A sub-0.1um circuit design with substrate-over-biasing
Sub Title (in English)
Keyword(1) 0.5V supply voltage
Keyword(2) sub-0.1un device
Keyword(3) substrate over-biasing technology
1st Author's Name Shigeyoshi Watanabe
1st Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation()
2nd Author's Name Yukihito Oowaki
2nd Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation
3rd Author's Name Mitsuhiro Noguchi
3rd Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation
4th Author's Name Tuneaki Fuse
4th Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation
5th Author's Name Kazumasa Sunouchi
5th Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation
6th Author's Name Hitomi Kawaguchiya
6th Author's Affiliation Research and Development Center, Advanced Semiconductor Devices Research Laboratories, Toshiba Corporation
Date 1998/6/19
Paper # ED98-72,SDM98-72,ICD98-71
Volume (vol) vol.98
Number (no) 121
Page pp.pp.-
#Pages 7
Date of Issue