Presentation | 1995/12/14 A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Current Testing Yukiya MIURA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | This paper describes the comparison of input stimuli as a means of testing mixed-signal circuits. Current testing that measures the integral of the power supply current in the time-domain is used to detect faults. The main objective is to achieve real-time testing in which there is no need to analyze the results of testing. Simulation results show that a step-voltage input stimulus is effective for detection of bridging and breaking faults in an A/D converter. Since this input signal allows the current to be measured at discrete time intervals, it is applicable for real-time current testing and can be used for built-in test and production test. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Current testing / Input stimuli / Real-time testing / Mixed-signal LSIs / A/D converters |
Paper # | ICD95-189 |
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Conference Information | |
Committee | ICD |
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Conference Date | 1995/12/14(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Current Testing |
Sub Title (in English) | |
Keyword(1) | Current testing |
Keyword(2) | Input stimuli |
Keyword(3) | Real-time testing |
Keyword(4) | Mixed-signal LSIs |
Keyword(5) | A/D converters |
1st Author's Name | Yukiya MIURA |
1st Author's Affiliation | Department of Electronics and Information Engineering, Tokyo Metropolitan University() |
Date | 1995/12/14 |
Paper # | ICD95-189 |
Volume (vol) | vol.95 |
Number (no) | 426 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |