Presentation 1995/12/14
A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Current Testing
Yukiya MIURA,
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Abstract(in English) This paper describes the comparison of input stimuli as a means of testing mixed-signal circuits. Current testing that measures the integral of the power supply current in the time-domain is used to detect faults. The main objective is to achieve real-time testing in which there is no need to analyze the results of testing. Simulation results show that a step-voltage input stimulus is effective for detection of bridging and breaking faults in an A/D converter. Since this input signal allows the current to be measured at discrete time intervals, it is applicable for real-time current testing and can be used for built-in test and production test.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Current testing / Input stimuli / Real-time testing / Mixed-signal LSIs / A/D converters
Paper # ICD95-189
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Conference Date 1995/12/14(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Current Testing
Sub Title (in English)
Keyword(1) Current testing
Keyword(2) Input stimuli
Keyword(3) Real-time testing
Keyword(4) Mixed-signal LSIs
Keyword(5) A/D converters
1st Author's Name Yukiya MIURA
1st Author's Affiliation Department of Electronics and Information Engineering, Tokyo Metropolitan University()
Date 1995/12/14
Paper # ICD95-189
Volume (vol) vol.95
Number (no) 426
Page pp.pp.-
#Pages 7
Date of Issue