| Presentation | 1995/12/14 Analog IDDQ Testing Method for Mixed-signal LSI Including 10-bit A/D Converter Hiroshi Noda, Masao Ito, Toshio Kumamoto, Tetsuo Tada, Tadashi Sumi, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | An analog IDDQ testing (Jagged Waveform) method to detect a function error of A/D converter cell without external test pins of a mixed-signal LSI including A/D converter is described. This proposal realizes a comparison between the measured power-supply current waveform and the ideal power-supply current waveform. The ideal power-supply current waveform is obtained from the difference of supply current of one comparator in the A/D converter depending on the comparator's output level. Applying the analog IDDQ testing method to a subranging A/D converter cell with 31 comparators [4], the function errors of the A/D converter, such as switch connection fault and comparator's function fault, have been detected successfully without the external test pins. Analog IDDQ testing method makes the use of external test pins unnecessary, and decreases the package size and LSI cost. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Analog IDDQ testing method / Power-supply current waveform / subranging A/D converter |
| Paper # | ICD95-188 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 1995/12/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analog IDDQ Testing Method for Mixed-signal LSI Including 10-bit A/D Converter |
| Sub Title (in English) | |
| Keyword(1) | Analog IDDQ testing method |
| Keyword(2) | Power-supply current waveform |
| Keyword(3) | subranging A/D converter |
| 1st Author's Name | Hiroshi Noda |
| 1st Author's Affiliation | System LSI Laboratory Mitsubishi Electric Corporation() |
| 2nd Author's Name | Masao Ito |
| 2nd Author's Affiliation | System LSI Laboratory Mitsubishi Electric Corporation |
| 3rd Author's Name | Toshio Kumamoto |
| 3rd Author's Affiliation | System LSI Laboratory Mitsubishi Electric Corporation |
| 4th Author's Name | Tetsuo Tada |
| 4th Author's Affiliation | System LSI Laboratory Mitsubishi Electric Corporation |
| 5th Author's Name | Tadashi Sumi |
| 5th Author's Affiliation | System LSI Laboratory Mitsubishi Electric Corporation |
| Date | 1995/12/14 |
| Paper # | ICD95-188 |
| Volume (vol) | vol.95 |
| Number (no) | 426 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |