Presentation 1995/5/26
A 3.3V Only 16Mb DINOR Flash Memory
S. Kobayashi, M. Mihara, Y. Miyawaki, M. Ishii, T. Futatsuya, A. Hosogane, A. Ohba, Y. Terada, N. Ajika, Y. Kunori, M. Hatanaka, H. Miyoshi, T. Yoshihara, Y. Uji, A. Matsuo, Y. Taniguchi, Y. Kiguchi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) A 16M bit 3.3V only DINOR flash memory whose erase unit is 64K byte has been developped. The memory cell size and the chip size are 1.35μm x 1.4 μm and 8.27mm x 9.3mm, respectively. We propose a new program verify scheme which utilizes bit-line shield and high performance positive charge pump circuit utilizing triple well p-n diode which can disregard the body effect of the MOS transistor. Utilizing these technologies, 47ns high speed random access time and 0.8V Vth distribution of the memory cells have been accomplished.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Flash memory / shielded bit line / charge pump / negative voltage control
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Conference Date 1995/5/26(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A 3.3V Only 16Mb DINOR Flash Memory
Sub Title (in English)
Keyword(1) Flash memory
Keyword(2) shielded bit line
Keyword(3) charge pump
Keyword(4) negative voltage control
1st Author's Name S. Kobayashi
1st Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation()
2nd Author's Name M. Mihara
2nd Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
3rd Author's Name Y. Miyawaki
3rd Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
4th Author's Name M. Ishii
4th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
5th Author's Name T. Futatsuya
5th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
6th Author's Name A. Hosogane
6th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
7th Author's Name A. Ohba
7th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
8th Author's Name Y. Terada
8th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
9th Author's Name N. Ajika
9th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
10th Author's Name Y. Kunori
10th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
11th Author's Name M. Hatanaka
11th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
12th Author's Name H. Miyoshi
12th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
13th Author's Name T. Yoshihara
13th Author's Affiliation ULSI Laboratory Mitsubishi Electric Corporation
14th Author's Name Y. Uji
14th Author's Affiliation Semiconductor & Integrated Circuits Div. Hitachi Ltd.
15th Author's Name A. Matsuo
15th Author's Affiliation Semiconductor & Integrated Circuits Div. Hitachi Ltd.
16th Author's Name Y. Taniguchi
16th Author's Affiliation Semiconductor & Integrated Circuits Div. Hitachi Ltd.
17th Author's Name Y. Kiguchi
17th Author's Affiliation Semiconductor & Integrated Circuits Div. Hitachi Ltd.
Date 1995/5/26
Paper #
Volume (vol) vol.95
Number (no) 72
Page pp.pp.-
#Pages 8
Date of Issue