Presentation 1993/8/19
Design approach for realizing highly reliable automotive microcomputers
Nobusuke Abe, Shozo Shirota,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Automotive microcomputers have two inherent requirements to be met that are more demanding than those for general microcomputers. One is the need to respond to tasks in the order of microseconds; the other is the need to satisfy calls for high quality and high reliability deriving from the automotive stringent working environments and high market requirement level.These needs, especially the latter one,have been responded to by further elaborating each elemental technology -- wafer process,assembly process,screening process,and reliability evaluation -- while at the same time building various logics into chips in the design stage.This paper deals with approaches from the design side to accomplishing the high quality,high reliability objective,focusing on such interesting topics as testability improvement,noise abatement,simplified analysis,and increased built-in ROM reliability.
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Keyword(in English) automotive microcomputer / high reliability / high quality / EPROM
Paper # ICD93-70
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Conference Date 1993/8/19(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Design approach for realizing highly reliable automotive microcomputers
Sub Title (in English)
Keyword(1) automotive microcomputer
Keyword(2) high reliability
Keyword(3) high quality
Keyword(4) EPROM
1st Author's Name Nobusuke Abe
1st Author's Affiliation Kita-itami Works,Mitsubishi Electric Corporation()
2nd Author's Name Shozo Shirota
2nd Author's Affiliation Kita-itami Works,Mitsubishi Electric Corporation
Date 1993/8/19
Paper # ICD93-70
Volume (vol) vol.93
Number (no) 187
Page pp.pp.-
#Pages 6
Date of Issue