Presentation 1997/3/7
Yield Optimization with approximate worst case
Hideki Ono, Hidetoshi Onodera, Keikichi Tamaru,
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Abstract(in English) Due to manufacturing process variations, the actual circuit response will be fluctuated on the performance at nominal point. Parametric design process is desirable to have higher yield. Estimating yiled with circuit simulation is very costly process. An approximate worst case design algorithm for parametric yield optimization is presented. In this method, fewer simulation run at one design point achives lower total simulation costs. Additionaly, importance sampling during optimization process reduce simulation runs. Practical example of IC optimization have shown that the algorithm is efficient.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Yield / Optimization / Approximate Worst Case / Analog CAD / Simulation costs
Paper # VLD96-101,ICD96-211
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Conference Date 1997/3/7(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Yield Optimization with approximate worst case
Sub Title (in English)
Keyword(1) Yield
Keyword(2) Optimization
Keyword(3) Approximate Worst Case
Keyword(4) Analog CAD
Keyword(5) Simulation costs
1st Author's Name Hideki Ono
1st Author's Affiliation Graduate School of Engineering, Kyoto University()
2nd Author's Name Hidetoshi Onodera
2nd Author's Affiliation Graduate School of Engineering, Kyoto University
3rd Author's Name Keikichi Tamaru
3rd Author's Affiliation Graduate School of Engineering, Kyoto University
Date 1997/3/7
Paper # VLD96-101,ICD96-211
Volume (vol) vol.96
Number (no) 558
Page pp.pp.-
#Pages 8
Date of Issue