Presentation | 1998/1/23 7.0ps Resolution GaAs Digital Variable Delay Macro Cell for measurement system A. Ohta, N. Higashisaka, T. Heima, T. Hisaka, H. Nakano, R. Ohmura, N. Tanino, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Recently, variable delay circuits with less than 10ps resolution have become more and more important for measurement instruments such as automatic test equipment. A 7.0ps resolution digital variable delay macro cell on a GaAs 100KG gate array is successfully developed. For high resolution in the digital variable delay macro cell, two technologies are introduced; (1) 63-stage delay circuit with a discharge control path for high resolution and good linearity, (2) a meshed air bridge structure for reduction of propagation delay time. Span of the macro cell can be controlled from 460ps to 940ps. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Variable Delay Circuit / Gate Array / Macro Cell / High resolution / GaAs |
Paper # | ICD97-216 |
Date of Issue |
Conference Information | |
Committee | ICD |
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Conference Date | 1998/1/23(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | 7.0ps Resolution GaAs Digital Variable Delay Macro Cell for measurement system |
Sub Title (in English) | |
Keyword(1) | Variable Delay Circuit |
Keyword(2) | Gate Array |
Keyword(3) | Macro Cell |
Keyword(4) | High resolution |
Keyword(5) | GaAs |
1st Author's Name | A. Ohta |
1st Author's Affiliation | Mitsubishi Electric Corporation Optoelectronic & Microwave Devices Laboratory() |
2nd Author's Name | N. Higashisaka |
2nd Author's Affiliation | Mitsubishi Electric Corporation Optoelectronic & Microwave Devices Laboratory |
3rd Author's Name | T. Heima |
3rd Author's Affiliation | Mitsubishi Electric Corporation Optoelectronic & Microwave Devices Laboratory |
4th Author's Name | T. Hisaka |
4th Author's Affiliation | Mitsubishi Electric Corporation High Frequency & Optical Semiconductor Div. |
5th Author's Name | H. Nakano |
5th Author's Affiliation | Mitsubishi Electric Corporation High Frequency & Optical Semiconductor Div. |
6th Author's Name | R. Ohmura |
6th Author's Affiliation | Mitsubishi Electric Corporation Product Engineering Div. |
7th Author's Name | N. Tanino |
7th Author's Affiliation | Mitsubishi Electric Corporation Optoelectronic & Microwave Devices Laboratory |
Date | 1998/1/23 |
Paper # | ICD97-216 |
Volume (vol) | vol.97 |
Number (no) | 482 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |