Presentation | 1997/9/26 MOSFET Statistical Modeling Method Using an Intermediate Model Masaki Kondo, Hidetoshi Onodera, Keikichi Tamaru, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We propose a new statistical modeling approach for deeply scaled MOSFETs. Our method is based on an intermediate model which consists of basic physical equations and parameters. In the first step, variations of 5 essencial physical parameters are modeled using the intermediate model. Then, SPICE statistical models are generated with linear transformation from the process parameters to the SPICE model parameters. The two distinctive advantages of the procedure are the high applicability to SPICE models and the consistency of statistical characteristics among different SPICE models. We have verified the method using a real variation data of a 0.35μm CMOS process. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | MOSFET / statistical model / statistical modeling / intermediate model |
Paper # | ICD97-146 |
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Committee | ICD |
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Conference Date | 1997/9/26(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | MOSFET Statistical Modeling Method Using an Intermediate Model |
Sub Title (in English) | |
Keyword(1) | MOSFET |
Keyword(2) | statistical model |
Keyword(3) | statistical modeling |
Keyword(4) | intermediate model |
1st Author's Name | Masaki Kondo |
1st Author's Affiliation | Department of Electronics and Communication, Kyoto University() |
2nd Author's Name | Hidetoshi Onodera |
2nd Author's Affiliation | Department of Electronics and Communication, Kyoto University |
3rd Author's Name | Keikichi Tamaru |
3rd Author's Affiliation | Department of Electronics and Communication, Kyoto University |
Date | 1997/9/26 |
Paper # | ICD97-146 |
Volume (vol) | vol.97 |
Number (no) | 275 |
Page | pp.pp.- |
#Pages | 8 |
Date of Issue |