| Presentation | 1997/9/26 Analysis of GaAs HJFET Mark Ratio Effect with Device Simulator for Cyclic Bias Application Yuji Takahashi, Kazuaki Kunihiro, Yasuo Ohno, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A two-dimensional device simulator for analyzing the steady-state of devices under cyclic bias application has been developed. With this simulator, we can simulate the steady state under the cyclic bias, which is used in normal device evaluation. Application of the simulator to the pulse-pattern effect of a GaAs HJFET showed that the low- and high-level drain currents varied with the mark ratio. These variations showed a non-linearity that became more significant as the pulse-amplitude increased. Thdse variations can be explained by SRH statistics model for the deep-level traps. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Device Simulator / Mark ratio Effect / Cyclic Bias / SRH statistics / HJFET |
| Paper # | ICD97-138 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 1997/9/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of GaAs HJFET Mark Ratio Effect with Device Simulator for Cyclic Bias Application |
| Sub Title (in English) | |
| Keyword(1) | Device Simulator |
| Keyword(2) | Mark ratio Effect |
| Keyword(3) | Cyclic Bias |
| Keyword(4) | SRH statistics |
| Keyword(5) | HJFET |
| 1st Author's Name | Yuji Takahashi |
| 1st Author's Affiliation | Opto Electronics and High Frequency Device Research Lab., NEC Corp.() |
| 2nd Author's Name | Kazuaki Kunihiro |
| 2nd Author's Affiliation | Opto Electronics and High Frequency Device Research Lab., NEC Corp. |
| 3rd Author's Name | Yasuo Ohno |
| 3rd Author's Affiliation | Opto Electronics and High Frequency Device Research Lab., NEC Corp. |
| Date | 1997/9/26 |
| Paper # | ICD97-138 |
| Volume (vol) | vol.97 |
| Number (no) | 275 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |