| Presentation | 1997/9/26 Analysis of Low-Frequency Dispersive Effects by Measuring S-paremeter and Using Physical FET Model Hirokazu Ichikawa, Kazuya Tokumasu, Hiroshi Kondoh, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have done the following to investigate the mechanism and origin of low-frequency dispersion of drain current of GaAs MESFET which is fabricated by ion-implantation method (a)measuring the frequency and time dispersion characteristics of drain current and S-parameters (b)calculating time dispersion of FET's circuit elements Having examined the correlation of time dispersion characteristics between drain current and circuit elements by using the Shockley model, we cocluded that two origins of low-frequency dispersive effects are dominant. Those are (1)Deep level that exists in the Gate/Channel interface and (2)Deep level that exists in the Channel. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | low-frequency dispersive effects / Gate/Drain lag / GaAS MESFET / ion-implantation / S-parameter / Shockley model |
| Paper # | ICD97-137 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 1997/9/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Low-Frequency Dispersive Effects by Measuring S-paremeter and Using Physical FET Model |
| Sub Title (in English) | |
| Keyword(1) | low-frequency dispersive effects |
| Keyword(2) | Gate/Drain lag |
| Keyword(3) | GaAS MESFET |
| Keyword(4) | ion-implantation |
| Keyword(5) | S-parameter |
| Keyword(6) | Shockley model |
| 1st Author's Name | Hirokazu Ichikawa |
| 1st Author's Affiliation | Hitachi, Ltd. Central Research Lab. Communication Systems Research Department() |
| 2nd Author's Name | Kazuya Tokumasu |
| 2nd Author's Affiliation | Hitachi, Ltd. Central Research Lab. Communication Systems Research Department |
| 3rd Author's Name | Hiroshi Kondoh |
| 3rd Author's Affiliation | Hitachi, Ltd. Central Research Lab. Communication Systems Research Department |
| Date | 1997/9/26 |
| Paper # | ICD97-137 |
| Volume (vol) | vol.97 |
| Number (no) | 275 |
| Page | pp.pp.- |
| #Pages | 11 |
| Date of Issue | |