Presentation | 1997/9/26 Two-Dimensional Numerical Analysis of Gate-Lag Phenomena in Recessed-Gate GaAs MESFETs T. Yamada, A. Wakabayashi, K. Horio, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | We have made two-dimensional simulation of recessed-gate GaAs MESFETs considering surface-state effects, and studied how the gate turn-on characteristics are affected by the recess depth d_r and the distance between the gate and the recess edge L_r. It is found that if d_r is deep and L_r is set to be very narrow, the gate-lag extinguishes for a case with surface states considered on the horizontal planes only. However, in a realistic case with surface states included on both the horizontal and the vertical planes, the gate-lag is not eliminated even if d_r is made rather deep. This is attributed to the fact that when the deep-acceptor-like surface state acts as a hole trap, the thickness of surface depletion layer under the same plane as the source and drain blectrodes can change much by the applied gate bias. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | GaAs / MESFET / gate-lag / recessed-gate structure / surface state / device simulation |
Paper # | ICD97-135 |
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Conference Information | |
Committee | ICD |
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Conference Date | 1997/9/26(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Two-Dimensional Numerical Analysis of Gate-Lag Phenomena in Recessed-Gate GaAs MESFETs |
Sub Title (in English) | |
Keyword(1) | GaAs |
Keyword(2) | MESFET |
Keyword(3) | gate-lag |
Keyword(4) | recessed-gate structure |
Keyword(5) | surface state |
Keyword(6) | device simulation |
1st Author's Name | T. Yamada |
1st Author's Affiliation | Faculty of Systems Engineering, Shibaura Institute of Technology() |
2nd Author's Name | A. Wakabayashi |
2nd Author's Affiliation | Faculty of Systems Engineering, Shibaura Institute of Technology |
3rd Author's Name | K. Horio |
3rd Author's Affiliation | Faculty of Systems Engineering, Shibaura Institute of Technology |
Date | 1997/9/26 |
Paper # | ICD97-135 |
Volume (vol) | vol.97 |
Number (no) | 275 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |