Presentation 2002/6/14
Influence of Si substrate crystal orientation on the properties of (Ba,Sr)TiO_3
M Yamato, H Yamada, K Quazi, T Kikkawa,
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Abstract(in English) We investigated the influence of Si substrate crystal orientation on the properties of (Ba,Sr)TiO_3. It is found that Si substrate crystal orientation affected not only BST crystal orientation but also the leakage current of the BST film. BST/Si(100) and BST/Si(111) showed lower leakage current than BST/Si(100). The interface state density of Ir/BST/Si capacitor depends on the Si crystal orientation, and BST/Si(111) showed the largest interface state density.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) (Ba,Sr)TiO_3 / BST / dielectric constant / leakage current / interface state density / silicon / crystal orientation
Paper # SDM2002-65
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Committee SDM
Conference Date 2002/6/14(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Influence of Si substrate crystal orientation on the properties of (Ba,Sr)TiO_3
Sub Title (in English)
Keyword(1) (Ba,Sr)TiO_3
Keyword(2) BST
Keyword(3) dielectric constant
Keyword(4) leakage current
Keyword(5) interface state density
Keyword(6) silicon
Keyword(7) crystal orientation
1st Author's Name M Yamato
1st Author's Affiliation Research Center for Nanodevices and Systems, Hiroshima University()
2nd Author's Name H Yamada
2nd Author's Affiliation Research Center for Nanodevices and Systems, Hiroshima University
3rd Author's Name K Quazi
3rd Author's Affiliation Research Center for Nanodevices and Systems, Hiroshima University
4th Author's Name T Kikkawa
4th Author's Affiliation Research Center for Nanodevices and Systems, Hiroshima University
Date 2002/6/14
Paper # SDM2002-65
Volume (vol) vol.102
Number (no) 134
Page pp.pp.-
#Pages 5
Date of Issue