Presentation | 2002/5/17 Deposition and characterization of SnS thin film by electrochemical deposition method with pulse voltage conditions Naoya Sato, Masaya Ichimura, Eisuke Arai, Yoshihisa Yamazaki, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | To produce semiconductor thin films for solar cells with low cost, we deposited and characterized tin sulphide (SnS) thin films by the electrochemical deposition method (ECD). We applied pulse voltage to the substrate in ECD and characterized deposited samples by scanning electron microscope, Auger electron spectroscopy and X-ray diffraction measurement. And we optimized the pulse voltage condition to improve the adhesion to the substrate, the surface morphology and the crystallinity. Furthermore, we made mesa structures on the substrate, and confirmed the semiconductor-like characteristics from the temperature dependence of current-voltage (I-V) characteristics. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electrochemical deposition method / tin sulphide(SnS) / pulse voltage / currentwoltage(I-V) measurements |
Paper # | SDM2002-42 |
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Committee | SDM |
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Conference Date | 2002/5/17(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Silicon Device and Materials (SDM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Deposition and characterization of SnS thin film by electrochemical deposition method with pulse voltage conditions |
Sub Title (in English) | |
Keyword(1) | electrochemical deposition method |
Keyword(2) | tin sulphide(SnS) |
Keyword(3) | pulse voltage |
Keyword(4) | currentwoltage(I-V) measurements |
1st Author's Name | Naoya Sato |
1st Author's Affiliation | Nagoya Institute of Technology() |
2nd Author's Name | Masaya Ichimura |
2nd Author's Affiliation | Nagoya Institute of Technology |
3rd Author's Name | Eisuke Arai |
3rd Author's Affiliation | Nagoya Institute of Technology |
4th Author's Name | Yoshihisa Yamazaki |
4th Author's Affiliation | Fuji Xerox Co., Ltd. |
Date | 2002/5/17 |
Paper # | SDM2002-42 |
Volume (vol) | vol.102 |
Number (no) | 81 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |