Presentation 2001/9/21
Study on Non-Stationary Process in Silicon Oxide Film Growth by Simulations
Kenji Nanjo, Yasumi Kotani, Yasuhisa Omura,
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Abstract(in English) This paper describes simulation results of oxide growth process in the conventional furnace tube oxidation on the basis of advanced models for realistic diffusion constant of oxygen molecules through the whole system and boundary conditions at O_2 gas/SiO_2 and SiO_2/Si substrate interfaces. It is clearly shown that the non-stationary state of oxygen flow and reaction is substantial in the initial stage of oxidation. Availability of values of physical parameters extracted from experimental results is examined by past experimental results and the ever-reported first-principle simulation results.
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Keyword(in English) Oxidation / Non-stationary process / Interstitial Si / Simulation
Paper # VLD2001-73,SDM2001-147
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Committee SDM
Conference Date 2001/9/21(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on Non-Stationary Process in Silicon Oxide Film Growth by Simulations
Sub Title (in English)
Keyword(1) Oxidation
Keyword(2) Non-stationary process
Keyword(3) Interstitial Si
Keyword(4) Simulation
1st Author's Name Kenji Nanjo
1st Author's Affiliation High-Technology Research Center, Kansai Uuniversity()
2nd Author's Name Yasumi Kotani
2nd Author's Affiliation High-Technology Research Center, Kansai University
3rd Author's Name Yasuhisa Omura
3rd Author's Affiliation High-Technology Research Center, Kansai University
Date 2001/9/21
Paper # VLD2001-73,SDM2001-147
Volume (vol) vol.101
Number (no) 321
Page pp.pp.-
#Pages 6
Date of Issue