Presentation 2001/9/20
Development of Physical Design Technology at STARC: Target and Activities
Hiroo MASUDA, Hiroyuki HARA, Fumihiro MINAMI, Atsushi MARUYAMA, Shinichi FUJIMOTO,
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Abstract(in English) Highly functional and high-performance SoC becomes practical target with scaled CMOS process available. However, classical physical mechanism, enhanced by small dimension process, becomes increasingly critical issues in terms of Signal Integrity (SI) design. On-chip interconnect L (inductance) under high frequency operation, crosstalk and IR drop on power grids, all of these physical design can be bottle-neck in a practical SoC development. STARC attacks this design problems with Test Structure fabricated updated process and intensive experiments on the SI phenomena.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SoC(System on a Chip) / SI(Signal Integrity) / TEG(Test Element Group) / STARC / Physical Design
Paper # VLD2001-72,SDM2001-146
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Conference Information
Committee SDM
Conference Date 2001/9/20(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Development of Physical Design Technology at STARC: Target and Activities
Sub Title (in English)
Keyword(1) SoC(System on a Chip)
Keyword(2) SI(Signal Integrity)
Keyword(3) TEG(Test Element Group)
Keyword(4) STARC
Keyword(5) Physical Design
1st Author's Name Hiroo MASUDA
1st Author's Affiliation Semiconductor Technology Academic Research Center (STARC)()
2nd Author's Name Hiroyuki HARA
2nd Author's Affiliation Semiconductor Technology Academic Research Center (STARC)
3rd Author's Name Fumihiro MINAMI
3rd Author's Affiliation Semiconductor Technology Academic Research Center (STARC)
4th Author's Name Atsushi MARUYAMA
4th Author's Affiliation Semiconductor Technology Academic Research Center (STARC)
5th Author's Name Shinichi FUJIMOTO
5th Author's Affiliation Semiconductor Technology Academic Research Center (STARC)
Date 2001/9/20
Paper # VLD2001-72,SDM2001-146
Volume (vol) vol.101
Number (no) 320
Page pp.pp.-
#Pages 6
Date of Issue