| Presentation | 2001/9/20 Modeling of Bias Dependent Fluctuations of Flicker Noise of MOSFETs Ken'ichiro SONODA, Motoaki TANIZAWA, Katsumi EIKYU, Kiyoshi ISHIKAWA, Toshio KUMAMOTO, Hiroyuki KOUNO, Masahide INUISHI, Yasuo INOUE, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Drain and gate bias dependent fluctuations of flicker noise of MOSFETs are explained in terms of carrier concentration distributions in a MOSFET channel. A proposed model well describes the increase of the fluctuation in the saturation region of operation. In addition, the gate bias dependence of the fluctuation in the saturation region can also be calculated using the model. Our model predicts that for any gate voltage change, the fluctuation in the saturation region will be 2.5 times that in the linear region. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | flicker noise / 1/ƒ noise / MOSFET / analog / RF |
| Paper # | VLD2001-70,SDM2001-144 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 2001/9/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Modeling of Bias Dependent Fluctuations of Flicker Noise of MOSFETs |
| Sub Title (in English) | |
| Keyword(1) | flicker noise |
| Keyword(2) | 1/ƒ noise |
| Keyword(3) | MOSFET |
| Keyword(4) | analog |
| Keyword(5) | RF |
| 1st Author's Name | Ken'ichiro SONODA |
| 1st Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp() |
| 2nd Author's Name | Motoaki TANIZAWA |
| 2nd Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp |
| 3rd Author's Name | Katsumi EIKYU |
| 3rd Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp |
| 4th Author's Name | Kiyoshi ISHIKAWA |
| 4th Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp |
| 5th Author's Name | Toshio KUMAMOTO |
| 5th Author's Affiliation | System LSI Div., Mitsubishi Electric Corp |
| 6th Author's Name | Hiroyuki KOUNO |
| 6th Author's Affiliation | System LSI Div., Mitsubishi Electric Corp |
| 7th Author's Name | Masahide INUISHI |
| 7th Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp |
| 8th Author's Name | Yasuo INOUE |
| 8th Author's Affiliation | ULSI Development Center, Mitsubishi Electric Corp |
| Date | 2001/9/20 |
| Paper # | VLD2001-70,SDM2001-144 |
| Volume (vol) | vol.101 |
| Number (no) | 320 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |