Presentation 2001/9/20
An Equivalent Circuit Model of ESD Protection Devices
Hiromi Anzai, Yoshiharu Tosaka, Kunihiro Suzuki, Toshio Nomura, Shigeo Satoh, Hideki Oka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) It is difficult to keep ESD (ElectroStatic Discharge) immunity of ESD protection devices. It is important to predict ESD immunity by circuit simulations. ESD protection devices have snapback characteristics that give a guide for ESD immunity. In this paper, we propose an equivalent circuit model which includes a modified base resistance model.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ESD immunity / snapback characteristic / equivalent circuit model / base resistance model
Paper # VLD2001-68,SDM2001-142
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Conference Information
Committee SDM
Conference Date 2001/9/20(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Equivalent Circuit Model of ESD Protection Devices
Sub Title (in English)
Keyword(1) ESD immunity
Keyword(2) snapback characteristic
Keyword(3) equivalent circuit model
Keyword(4) base resistance model
1st Author's Name Hiromi Anzai
1st Author's Affiliation Fujitsu Laboratories Ltd.()
2nd Author's Name Yoshiharu Tosaka
2nd Author's Affiliation Fujitsu Laboratories Ltd.
3rd Author's Name Kunihiro Suzuki
3rd Author's Affiliation Fujitsu Laboratories Ltd.
4th Author's Name Toshio Nomura
4th Author's Affiliation FUJITSU LIMITED
5th Author's Name Shigeo Satoh
5th Author's Affiliation FUJITSU LIMITED
6th Author's Name Hideki Oka
6th Author's Affiliation Fujitsu Laboratories Ltd.
Date 2001/9/20
Paper # VLD2001-68,SDM2001-142
Volume (vol) vol.101
Number (no) 320
Page pp.pp.-
#Pages 6
Date of Issue