Presentation 2001/6/30
Characterization of Temperature Dependence of High-Frequency Performance of AlGaN/GaN HEMTs
Takashi Mizutani, Mitsutoshi Akita, Shigeru Kishimoto,
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Abstract(in English) High-frequency performance of the 1.3-μm-long-gate AlGaN/GaN HEMTs have been evaluated by S-parameter measurements at temperatures between 23 and 187℃. The cutoff frequency f_T decreased monotonically with increase in temperature. It was 13.7 and 8.7 GHz at 23 and 187℃, respectively. The effective electron velocities v_ in the channel evaluated by the total delay time analysis were 1.2 and 0.8 x 10^7 cm/s at 23 and 187℃, respectively. It has been shown that the temperature dependence of f_T is dominated by that of v_. The smaller effective electron velocity and its larger temperature dependence than the peak velocity obtained by Monte Carlo simulation was explained by the smaller electric field in the channel than the peak field.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) AlGaN/GaN HEMT / temperature dependence / high-frequency performance / electron velocity
Paper # ED2001-98,SDM2001-105
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Committee SDM
Conference Date 2001/6/30(1days)
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Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Characterization of Temperature Dependence of High-Frequency Performance of AlGaN/GaN HEMTs
Sub Title (in English)
Keyword(1) AlGaN/GaN HEMT
Keyword(2) temperature dependence
Keyword(3) high-frequency performance
Keyword(4) electron velocity
1st Author's Name Takashi Mizutani
1st Author's Affiliation Department of Quantum Engineering, Nagoya University()
2nd Author's Name Mitsutoshi Akita
2nd Author's Affiliation Department of Quantum Engineering, Nagoya University
3rd Author's Name Shigeru Kishimoto
3rd Author's Affiliation Department of Quantum Engineering, Nagoya University
Date 2001/6/30
Paper # ED2001-98,SDM2001-105
Volume (vol) vol.101
Number (no) 165
Page pp.pp.-
#Pages 5
Date of Issue