Presentation 2001/2/21
Study on quantum-size effects and alloying effects of InAs-and InGaAs-quantum dots on GaAs(001)using scanning tunneling spectroscopy
T. Yamauchi, Y. Ohyama, Y. Matsuba, M. Tabuchi, A. Nakamura,
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Abstract(in English) Using scanning tunneling spectroscopy, we have investigated a correlation between a electronic structure and morphological structure of InAs and InGaAs quantum dots(QDs)grown on GaAs(001). The observed height dependence of the gap energy has been well reproduced by the calculated one. For InAs QDs, comparison of the observed dependence with the calculated one indicates that the gap energy of a single InAs QD is mainly determined by the quantum confinement in the vertical direction of the QD. For In_<0.46>Ga_<0.54>As QDs, however, the comparison shows that enrichment of In-composition in the dot compared to the nominal composition.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) InAs / InGaAs / quantum dot / quantum-size-effect / alloying / STM / STS
Paper # ED2000-252,SDM2000-206
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Committee SDM
Conference Date 2001/2/21(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on quantum-size effects and alloying effects of InAs-and InGaAs-quantum dots on GaAs(001)using scanning tunneling spectroscopy
Sub Title (in English)
Keyword(1) InAs
Keyword(2) InGaAs
Keyword(3) quantum dot
Keyword(4) quantum-size-effect
Keyword(5) alloying
Keyword(6) STM
Keyword(7) STS
1st Author's Name T. Yamauchi
1st Author's Affiliation CREST of Japan Science and Technology Corporation(JST)()
2nd Author's Name Y. Ohyama
2nd Author's Affiliation Graduate school of engineering, Nagoya University
3rd Author's Name Y. Matsuba
3rd Author's Affiliation Graduate school of engineering, Nagoya University
4th Author's Name M. Tabuchi
4th Author's Affiliation Graduate school of engineering, Nagoya University
5th Author's Name A. Nakamura
5th Author's Affiliation CREST of Japan Science and Technology Corporation(JST):Center for Integrated Research in Science and Engineering, Nagoya University
Date 2001/2/21
Paper # ED2000-252,SDM2000-206
Volume (vol) vol.100
Number (no) 643
Page pp.pp.-
#Pages 6
Date of Issue