Presentation | 2000/11/23 Improvement of analog characteristics by epitaxial channel structure T. Ohguro, R. Hasumi, M. Nishigori, H. Oyamatsu, F. Matsuoka, Y. Toyoshima, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Analog characteristics such as ft, Rf noise and flicker noise of 0.11μm CMOS under from 2.0 to 0.5V were investigated. A 1.0 V was lower supply voltage limitation in the case of 0.11 μm CMOS from point of N.F_ |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Halo implantation / analog characteristics / 1/f noise / spice model |
Paper # | SDM2000-165 |
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Conference Information | |
Committee | SDM |
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Conference Date | 2000/11/23(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Silicon Device and Materials (SDM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Improvement of analog characteristics by epitaxial channel structure |
Sub Title (in English) | |
Keyword(1) | Halo implantation |
Keyword(2) | analog characteristics |
Keyword(3) | 1/f noise |
Keyword(4) | spice model |
1st Author's Name | T. Ohguro |
1st Author's Affiliation | Toshiba Semiconductor company System LSI research & development center() |
2nd Author's Name | R. Hasumi |
2nd Author's Affiliation | Toshiba Semiconductor company System LSI research & development center |
3rd Author's Name | M. Nishigori |
3rd Author's Affiliation | Toshiba Semiconductor company System LSI research & development center |
4th Author's Name | H. Oyamatsu |
4th Author's Affiliation | Toshiba Semiconductor company System LSI research & development center |
5th Author's Name | F. Matsuoka |
5th Author's Affiliation | Toshiba Semiconductor company System LSI research & development center |
6th Author's Name | Y. Toyoshima |
6th Author's Affiliation | Toshiba Semiconductor company System LSI research & development center |
Date | 2000/11/23 |
Paper # | SDM2000-165 |
Volume (vol) | vol.100 |
Number (no) | 477 |
Page | pp.pp.- |
#Pages | 7 |
Date of Issue |