Presentation 2000/3/8
Study of initial growth stage by "In-situ" monitoring growth of dielectric oxide : "In-situ" monitoring growth of TiO_2 thin films using laser Raman spectroscopy
K. Morisawa, K. Nishida, S. Muraishi, A. Hiraki, T. Katoda,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In-Situ
Keyword(in Japanese) (See Japanese page)
Keyword(in English) In-situ
Paper # ED99-319,SDM99-212
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Conference Information
Committee SDM
Conference Date 2000/3/8(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study of initial growth stage by "In-situ" monitoring growth of dielectric oxide : "In-situ" monitoring growth of TiO_2 thin films using laser Raman spectroscopy
Sub Title (in English)
Keyword(1) In-situ
1st Author's Name K. Morisawa
1st Author's Affiliation Kochi University of Technology()
2nd Author's Name K. Nishida
2nd Author's Affiliation Kochi University of Technology
3rd Author's Name S. Muraishi
3rd Author's Affiliation Kochi University of Technology : JEOL Ltd.
4th Author's Name A. Hiraki
4th Author's Affiliation Kochi University of Technology
5th Author's Name T. Katoda
5th Author's Affiliation Kochi University of Technology
Date 2000/3/8
Paper # ED99-319,SDM99-212
Volume (vol) vol.99
Number (no) 672
Page pp.pp.-
#Pages 6
Date of Issue