| Presentation | 1999/6/24 LSI's towards the Year 2010 and Low-Power Technology Takayasu Sakurai, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Looking into the scaling law carefully, we find that three crises can be stringent in realizing LSI's of the year 2010:namely power crisis, interconnection crisis, and complexity crisis. In this paper, issues and possible solutions are described for these crises, with special emphasis on low-power technologies. The technologies to reduce the power consumption of LSI's range from software and architecture level to circuit and device level. Delay, reliability, TAT. cost and power tend to be determined by interconnections in the future. The signal integrity will become an important concern of LSI designers together with IP-based designs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI / low-power / interconnection / low-voltage / scaling |
| Paper # | SDM99-38 |
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| Conference Information | |
| Committee | SDM |
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| Conference Date | 1999/6/24(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Silicon Device and Materials (SDM) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | LSI's towards the Year 2010 and Low-Power Technology |
| Sub Title (in English) | |
| Keyword(1) | LSI |
| Keyword(2) | low-power |
| Keyword(3) | interconnection |
| Keyword(4) | low-voltage |
| Keyword(5) | scaling |
| 1st Author's Name | Takayasu Sakurai |
| 1st Author's Affiliation | Center for Collaborative Research, and Institute of Industrial Science, University of Tokyo() |
| Date | 1999/6/24 |
| Paper # | SDM99-38 |
| Volume (vol) | vol.99 |
| Number (no) | 147 |
| Page | pp.pp.- |
| #Pages | 8 |
| Date of Issue | |