Presentation 1994/5/27
Work Line Boost and Row-Redundancy Scheme for Flash Memory
Masaaki Mihara, Takeshi Nakayama, Minoru Ohkawa, Shinji Kawai, Yoshikazu Miyawaki, Yasushi Terada,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) A high efficiency charge pump circuit,heap-charge-pump circuit, boosts up the word line voltage high enough for low Vcc operation. Row redundancy scheme utilizing Gray code has substantially improved the yield of NOR-type flash memory. Utilizing these technologies,a 3.3 V operation 16-Mb CMOS flash memory has been designed and fabricated based on 0.5 μm CMOS techn ology.The cell size is 1.7 μm X 1.9 μm and the chip size is 9.3 m m X 11.5 mm.The access time of 65 ns is achieved at 3.3 V Vcc.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Flash Memory / charge pump circuit / word line boost / redundancy
Paper # SDM94-30,ICD94-41
Date of Issue

Conference Information
Committee SDM
Conference Date 1994/5/27(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Work Line Boost and Row-Redundancy Scheme for Flash Memory
Sub Title (in English)
Keyword(1) Flash Memory
Keyword(2) charge pump circuit
Keyword(3) word line boost
Keyword(4) redundancy
1st Author's Name Masaaki Mihara
1st Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation()
2nd Author's Name Takeshi Nakayama
2nd Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation
3rd Author's Name Minoru Ohkawa
3rd Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation
4th Author's Name Shinji Kawai
4th Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation
5th Author's Name Yoshikazu Miyawaki
5th Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation
6th Author's Name Yasushi Terada
6th Author's Affiliation ULSI Laboratory,Mitsubishi Electric Corporation
Date 1994/5/27
Paper # SDM94-30,ICD94-41
Volume (vol) vol.94
Number (no) 73
Page pp.pp.-
#Pages 8
Date of Issue