Presentation 1998/8/21
Miniaturized MOSFET with Fully-Self-Aligned Metallization for GHz-band Power Amplifier
M Yokoyama, A. Morimoto, T. Saito, K. Masu, K. Tsubouchi,
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Abstract(in English) In sub-0.1-um MOSFETs, interconnect parasitics are drastically limitting the performance improvement. we have proposed the FSAM (Fully-Self-Alligned-Metallization) MOSFET using selective Al-CVD for reduction of the parasitic resistances. In this papaer, parasitic resistances in both FSAM and conventional SALICIDE devices are studied from the viewpoint of analog RF application. Simulation results show that FSAm devices are much effective in reduction of parasitic resistances for application to wide-gate GHz-band power amplifiers.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Miniaturized MOSFET / parasitic resistance / selective Al CVD / RF power amplifier
Paper # SDM98-130
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Conference Information
Committee SDM
Conference Date 1998/8/21(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Miniaturized MOSFET with Fully-Self-Aligned Metallization for GHz-band Power Amplifier
Sub Title (in English)
Keyword(1) Miniaturized MOSFET
Keyword(2) parasitic resistance
Keyword(3) selective Al CVD
Keyword(4) RF power amplifier
1st Author's Name M Yokoyama
1st Author's Affiliation Research Institute of Electrical Communication, Tohoku University()
2nd Author's Name A. Morimoto
2nd Author's Affiliation Research Institute of Electrical Communication, Tohoku University
3rd Author's Name T. Saito
3rd Author's Affiliation Research Institute of Electrical Communication, Tohoku University
4th Author's Name K. Masu
4th Author's Affiliation Research Institute of Electrical Communication, Tohoku University
5th Author's Name K. Tsubouchi
5th Author's Affiliation Research Institute of Electrical Communication, Tohoku University
Date 1998/8/21
Paper # SDM98-130
Volume (vol) vol.98
Number (no) 243
Page pp.pp.-
#Pages 5
Date of Issue