Presentation | 1998/8/20 Excellent Silicon Dioxide Formation by High-Density Plasma Ryu Kaihara, Masaki Hirayama, Tadahiro Ohmi, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | High-integrity thin silicon dioxide (SiO_2) can be obtained at a temperature of 430℃ by a new high-density plasma source. The plasma source is characterized by very low ion bonbardment energy and excellent uniformity. The breakdown field (E_BD) of 15.8MV/cm and change-to-breakdown value (Q_BD) of 12.8C/cm^2 under constant current stress of 0.1A/cm^2 (substrate injection) were acheived by the He/O_2 plasma. These electrical properties were equivalent to those of thermal oxide film grown at a temperature of 900℃. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | High-density Plasma / Low temperature oxidation / low ion bombardment energy / He plasma |
Paper # | SDM98-114 |
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Conference Information | |
Committee | SDM |
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Conference Date | 1998/8/20(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Silicon Device and Materials (SDM) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Excellent Silicon Dioxide Formation by High-Density Plasma |
Sub Title (in English) | |
Keyword(1) | High-density Plasma |
Keyword(2) | Low temperature oxidation |
Keyword(3) | low ion bombardment energy |
Keyword(4) | He plasma |
1st Author's Name | Ryu Kaihara |
1st Author's Affiliation | Department of Electronic Engineering, Graduate School of Engineering, Tohoku University() |
2nd Author's Name | Masaki Hirayama |
2nd Author's Affiliation | Department of Electronic Engineering, Graduate School of Engineering, Tohoku University |
3rd Author's Name | Tadahiro Ohmi |
3rd Author's Affiliation | New Industry Creation Hatchery Center, Tohoku University |
Date | 1998/8/20 |
Paper # | SDM98-114 |
Volume (vol) | vol.98 |
Number (no) | 242 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |