Presentation 1998/8/20
Excellent Silicon Dioxide Formation by High-Density Plasma
Ryu Kaihara, Masaki Hirayama, Tadahiro Ohmi,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) High-integrity thin silicon dioxide (SiO_2) can be obtained at a temperature of 430℃ by a new high-density plasma source. The plasma source is characterized by very low ion bonbardment energy and excellent uniformity. The breakdown field (E_BD) of 15.8MV/cm and change-to-breakdown value (Q_BD) of 12.8C/cm^2 under constant current stress of 0.1A/cm^2 (substrate injection) were acheived by the He/O_2 plasma. These electrical properties were equivalent to those of thermal oxide film grown at a temperature of 900℃.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) High-density Plasma / Low temperature oxidation / low ion bombardment energy / He plasma
Paper # SDM98-114
Date of Issue

Conference Information
Committee SDM
Conference Date 1998/8/20(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Excellent Silicon Dioxide Formation by High-Density Plasma
Sub Title (in English)
Keyword(1) High-density Plasma
Keyword(2) Low temperature oxidation
Keyword(3) low ion bombardment energy
Keyword(4) He plasma
1st Author's Name Ryu Kaihara
1st Author's Affiliation Department of Electronic Engineering, Graduate School of Engineering, Tohoku University()
2nd Author's Name Masaki Hirayama
2nd Author's Affiliation Department of Electronic Engineering, Graduate School of Engineering, Tohoku University
3rd Author's Name Tadahiro Ohmi
3rd Author's Affiliation New Industry Creation Hatchery Center, Tohoku University
Date 1998/8/20
Paper # SDM98-114
Volume (vol) vol.98
Number (no) 242
Page pp.pp.-
#Pages 5
Date of Issue