Presentation 1998/12/10
Characterization of crystaline silicon grown by PECVD for thin film solar cell
K Kurobe, T Fuyuki, H Matsunami,
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Abstract(in English) Silicon epitaxial growth has been studied by using the plasma-enhanced chemical vapor deposition(PECVD)method with SiH_2Cl_2, H_2 and Ar gases at temperatures between 900and 1050℃. The growth rate increased with RF power(<50W)and only the emission spectra of SiCl_2 and Ar are observed. The electrical properties of undoped epitaxial layers are investigated and little difference is found between the grown layers with and without plasma in Hall mobility. The diffusion length of p-doped layer with plasma measured about 20μm and that leads the possibility for thin filmsolar cell.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) thin film / solar cell / crystaline silicon / PECVD / SiH_2Cl_2 / optical emission spectroscopy
Paper # SDM98-171
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Conference Information
Committee SDM
Conference Date 1998/12/10(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Characterization of crystaline silicon grown by PECVD for thin film solar cell
Sub Title (in English)
Keyword(1) thin film
Keyword(2) solar cell
Keyword(3) crystaline silicon
Keyword(4) PECVD
Keyword(5) SiH_2Cl_2
Keyword(6) optical emission spectroscopy
1st Author's Name K Kurobe
1st Author's Affiliation Department of Electronic Science and Engineering, Kyoto University()
2nd Author's Name T Fuyuki
2nd Author's Affiliation Nara Institute of Science and Technology
3rd Author's Name H Matsunami
3rd Author's Affiliation Department of Electronic Science and Engineering, Kyoto University
Date 1998/12/10
Paper # SDM98-171
Volume (vol) vol.98
Number (no) 445
Page pp.pp.-
#Pages 6
Date of Issue