Presentation 1998/12/10
Determination of Donor Densities and Energy Levels in SiC by a New Graphical Method Based on the Temperature Dependence of Majority-Carrier Concentration
Hideharu Matsuura, Tunenobu Kimoto, Hiroyuki Matsunami,
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Abstract(in English) We proposed and discuss a new method for determining the densities and energy levels of dopants and traps in a semiconductor by the temperature dependence n(T) of majority-carrier concentration. Using n(T) N-doped n-type 4HSiC measured by means of Hall-effect measurement, we determine the densities and energy levels of donors by the method proposed here. Two types of donors due to N atoms were confirmed, and the obtained values of the densities and energy levels were found to be reliable.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) dopant / trap / evaluation method / temperature dependence of majority-carrier concentration / 4HSiC / Hall-effect measurement
Paper # SDM98-169
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Committee SDM
Conference Date 1998/12/10(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Determination of Donor Densities and Energy Levels in SiC by a New Graphical Method Based on the Temperature Dependence of Majority-Carrier Concentration
Sub Title (in English)
Keyword(1) dopant
Keyword(2) trap
Keyword(3) evaluation method
Keyword(4) temperature dependence of majority-carrier concentration
Keyword(5) 4HSiC
Keyword(6) Hall-effect measurement
1st Author's Name Hideharu Matsuura
1st Author's Affiliation Department of Electronics, Osaka Electro-Communication University()
2nd Author's Name Tunenobu Kimoto
2nd Author's Affiliation Department of Electronics Science and Engineering, Kyoto University
3rd Author's Name Hiroyuki Matsunami
3rd Author's Affiliation Department of Electronics Science and Engineering, Kyoto University
Date 1998/12/10
Paper # SDM98-169
Volume (vol) vol.98
Number (no) 445
Page pp.pp.-
#Pages 6
Date of Issue