Presentation 1993/4/22
Intial Stage of the Thermal Oxidation on Si(111)7×7 Surtace.
Yukinori Ono, Michiharu Tabe, Hiroyuki Kageshima,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The initial stages of the thermal oxidation process on Si(111)7× 7 surfaces have been studied using STM,XPS and STM simulation based on the empirical tight binding method.The thermal(600℃)oxida tion process is described as follows:In the very early stage, island oxides with a diameter of 10-100Å are formed.These islands have a local thickness of 2-3 Si layers.(On the other hand,room- temperature oxides are as small as single stoms and scattered randomly over the entire surface.)The island oxides grow in both lateral and vertical directions with the increased oxygen exposure. After further oxidation,the islands coalesce into a continuous oxide film.
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Keyword(in English) Si / SiO_2 / thermal oxidation / STM / XPS / empirical tight binding method
Paper # SDM93-5
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Committee SDM
Conference Date 1993/4/22(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Intial Stage of the Thermal Oxidation on Si(111)7×7 Surtace.
Sub Title (in English)
Keyword(1) Si
Keyword(2) SiO_2
Keyword(3) thermal oxidation
Keyword(4) STM
Keyword(5) XPS
Keyword(6) empirical tight binding method
1st Author's Name Yukinori Ono
1st Author's Affiliation NTT LSI Laboratories()
2nd Author's Name Michiharu Tabe
2nd Author's Affiliation NTT LSI Laboratories
3rd Author's Name Hiroyuki Kageshima
3rd Author's Affiliation NTT LSI Laboratories
Date 1993/4/22
Paper # SDM93-5
Volume (vol) vol.93
Number (no) 7
Page pp.pp.-
#Pages 7
Date of Issue