Presentation 1993/7/26
THEORETICAL ANALYSIS ON HOT CARRIER GENERATION IN MOSFETs
Yasuhisa Omura,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) The conventional energy balance equation is examined and a new formulation is carried out by taking into account the exact kinetic energy.Steady state solutions for carrier temperature and carrier mobility are described as a function of the longitudinal electric field and the carrier concentration.It is found that the carrier temperature is higher than expected by conventional models. It is also shown that the mobility expression is consistent with experimental results.The nonsteady state solution of the carrier temperature shows that the influence of the transverse electric field is strongly modulated by the longitudinal electric field.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) MOSFET / Hot carrier / Energy balance equation / Gate-field- induced effect
Paper # SDM93-64
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Conference Information
Committee SDM
Conference Date 1993/7/26(1days)
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Paper Information
Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) THEORETICAL ANALYSIS ON HOT CARRIER GENERATION IN MOSFETs
Sub Title (in English)
Keyword(1) MOSFET
Keyword(2) Hot carrier
Keyword(3) Energy balance equation
Keyword(4) Gate-field- induced effect
1st Author's Name Yasuhisa Omura
1st Author's Affiliation NTT LSI Laboratories()
Date 1993/7/26
Paper # SDM93-64
Volume (vol) vol.93
Number (no) 172
Page pp.pp.-
#Pages 8
Date of Issue