Presentation 1995/4/21
Valence-band discontinuity at InAs nanocrystal/Se-terminated GaAs hetero - interface
Yoshio Watanabe, Fumihiko Maeda, Takanori Kiyokura, Masaharu Oshima,
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Abstract(in English) We studied InAs epitaxial nanocrystal growth by MBE on a Se-terminated GaAs surface as well as on an As-stabilized GaAs surface by in situ synchrotron radiation photoelectron spectroscopy and ultraviolet photoelectron spectroscopy to evaluate the valence-band discontinuity at hetero-interfaces. Our measurements yield valence-band offset values of -0.02 eV for InAs on As-stabilized GaAs and -0.18 eV for InAs on Se-terminated GaAs. This result implies that hole carriers can be confined in InAs nanocrystals on Se-terminated GaAs.
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Keyword(in English) nanocrystal / selenium-treatment / synchrotron radiation / photoelectron spectroscopy / band discontinuity
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Committee SDM
Conference Date 1995/4/21(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Valence-band discontinuity at InAs nanocrystal/Se-terminated GaAs hetero - interface
Sub Title (in English)
Keyword(1) nanocrystal
Keyword(2) selenium-treatment
Keyword(3) synchrotron radiation
Keyword(4) photoelectron spectroscopy
Keyword(5) band discontinuity
1st Author's Name Yoshio Watanabe
1st Author's Affiliation NTT Interdisciplinary Research Laboratories()
2nd Author's Name Fumihiko Maeda
2nd Author's Affiliation NTT Interdisciplinary Research Laboratories
3rd Author's Name Takanori Kiyokura
3rd Author's Affiliation NTT Interdisciplinary Research Laboratories
4th Author's Name Masaharu Oshima
4th Author's Affiliation NTT Interdisciplinary Research Laboratories
Date 1995/4/21
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Volume (vol) vol.95
Number (no) 10
Page pp.pp.-
#Pages 6
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