Presentation 1996/12/5
Near-Infrared Photoluminescence from Si Nanocrystals
S. Takeoka, Y. Kanzawa, M Fujii, S. Hayashi, K. Yamamoto,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Photoluminescence (PL) from Si nanocrystals(2.7-5.5nm) embedded in Si0_2 thin films was stud-led. It was found that Si nanocrystals as small as 3-4nm in diameter exhibit a peak in the near infrared region (1.4-1.5eV). As the size decreased, the PL peak shifted to higher energies and its intensity increased. The temperature dependence of the peak energy was found to be very similar to that of the bulk Si crystal. These suggest that the PL peak arises from the recombination of electrons and holes in Si nanocrystals. At low temperature (<150K), another peak probably associated with the defects at Si-SiO_2 interface was observed at about 0.9eV.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si nanocrystals / PL / near-infrared / temperature dependence / quantum size effect / defect level
Paper # SDM96-142
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Conference Information
Committee SDM
Conference Date 1996/12/5(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Near-Infrared Photoluminescence from Si Nanocrystals
Sub Title (in English)
Keyword(1) Si nanocrystals
Keyword(2) PL
Keyword(3) near-infrared
Keyword(4) temperature dependence
Keyword(5) quantum size effect
Keyword(6) defect level
1st Author's Name S. Takeoka
1st Author's Affiliation The Graduate School of Science and Technology, Kobe University()
2nd Author's Name Y. Kanzawa
2nd Author's Affiliation The Graduate School of Science and Technology, Kobe University
3rd Author's Name M Fujii
3rd Author's Affiliation The Graduate School of Science and Technology, Kobe University
4th Author's Name S. Hayashi
4th Author's Affiliation Department of Electrical and Electronics Engineering, Faculty of Engineering, Kobe University
5th Author's Name K. Yamamoto
5th Author's Affiliation Department of Electrical and Electronics Engineering, Faculty of Engineering, Kobe University
Date 1996/12/5
Paper # SDM96-142
Volume (vol) vol.96
Number (no) 395
Page pp.pp.-
#Pages 7
Date of Issue