Presentation 1997/9/25
An Implementation of Transient Enhanced Diffusion Model into the FEM-based 2-D Process Simulator FFEAST
N. Sugiyasu, K. Suzuki, S. Kojima, Y. Ohyama, H. Goto,
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Abstract(in English) We have proposed a coupled and de-coupled combined method to solve the PDE for a transient enhanced diffusion model. In the case of a boron diffusion process, the sum of interstitial Si and impurity-interstitial pair concentration, the sum of vacancy and impurity-vacancy pair concentration, and each chemivcal impurity concentration are kept constant and the charge neutrality law is applied. This procedure has realized a robust solution system which is implemented to the FEM-based 2-D process simulator FFEAST, and transient enhanced diffusion simulation for a sub-quarter micron nMOSFET has been demonstrated.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Peocess Simulation / Transient Enhanced Diffusion / Solution
Paper # SDM97-106
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Committee SDM
Conference Date 1997/9/25(1days)
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Registration To Silicon Device and Materials (SDM)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Implementation of Transient Enhanced Diffusion Model into the FEM-based 2-D Process Simulator FFEAST
Sub Title (in English)
Keyword(1) Peocess Simulation
Keyword(2) Transient Enhanced Diffusion
Keyword(3) Solution
1st Author's Name N. Sugiyasu
1st Author's Affiliation Technblogy Development Divion, Fujitsu Limited()
2nd Author's Name K. Suzuki
2nd Author's Affiliation Technblogy Development Divion, Fujitsu Limited
3rd Author's Name S. Kojima
3rd Author's Affiliation Technblogy Development Divion, Fujitsu Limited
4th Author's Name Y. Ohyama
4th Author's Affiliation Technblogy Development Divion, Fujitsu Limited
5th Author's Name H. Goto
5th Author's Affiliation Technblogy Development Divion, Fujitsu Limited
Date 1997/9/25
Paper # SDM97-106
Volume (vol) vol.97
Number (no) 272
Page pp.pp.-
#Pages 7
Date of Issue